Add capacitive touch-button test optimized from btntest.

TTP223-style debounce (majority, min touch, rearm), SoftSPI+LVGL shell, flashable firmware/cyd.

Co-authored-by: Cursor <cursoragent@cursor.com>
This commit is contained in:
2026-10-23 13:15:39 +08:00
commit 7f0f391705
23 changed files with 2014 additions and 0 deletions

16
include/button.h Normal file
View File

@@ -0,0 +1,16 @@
#pragma once
#include <stdint.h>
void button_init();
/** 轮询:检测有效触摸边沿,返回本周期是否有一次有效触摸 */
bool button_poll_press();
uint32_t button_count();
void button_reset_count();
bool button_is_down();
/** 当前持续触摸时长(ms);未触摸为 0 */
uint32_t button_hold_ms();
/** 原始电平:1=HIGH,0=LOW */
int button_raw_level();
/** 触摸有效电平:1=HIGH 有效,0=LOW 有效(开机按空闲电平自动判定) */
int button_active_level();